High resolution SEM images

Failure analysis is the investigation of a failure in a product life cycle to determine the failure causes and the corrective actions needed to prevent future failures. Failure analysis allows to save money, lives and resources if done and implemented correctly. It is an important discipline in many sectors of manufacturing industry where it is used in the development of new products and for the improvement of existing ones.
The failure analysis process is based on the collection of failed products for subsequent examination of the failure causes using a wide array of techniques for observation, inspection and laboratory testing. Among the most used techniques there is the microscopy, a non-destructive test method that allows to analyze defective products without them be affected by the analysis. The high-resolution images obtained with a scanning electron microscope (SEM) are ideal to verify the presence of micro defects in products come from various industries such as microelectronics, precision mechanics, automotive / aerospace, chemical, metallurgy etc. Electron microscopy also allows to combine image analysis with compositional microanalysis using an EDS probe. Confirm chemical composition of a material and identify any contaminants through EDS analysis can help to determine if the material is of proper type and grade, whether it meet appropriate standards, and whether deviation from the specifications contributed to the fracture, wear, breaks, corrosion and failure.
The desktop SEMs present in our laboratory allow to quickly obtain high resolution images for microstructural analysis and chemical microanalysis for the quality evaluation of products and support in failure analysis.